Pandey, Abhishek, and S. Mohanraj. “Defect Detection Approach in Manufacturing Environments Using Customizable Convolutional Neural Networks With Multi-Scale Attention Mechanisms”. Journal of Neonatal Surgery, vol. 14, no. 2S, Feb. 2025, pp. 828-39, https://jneonatalsurg.com/index.php/jns/article/view/9567.