PANDEY, Abhishek; MOHANRAJ, S. Defect Detection Approach in Manufacturing Environments using Customizable Convolutional Neural Networks with Multi-Scale Attention Mechanisms. Journal of Neonatal Surgery, Lahore, Pakistan, v. 14, n. 2S, p. 828–839, 2025. Disponível em: https://jneonatalsurg.com/index.php/jns/article/view/9567. Acesso em: 21 jan. 2026.